H-3400 SEM

The Hitachi 3400N VP-SEM is a Scanning Electron Microscope with Tungsten Filament allowing accelerating voltages up to 30kV. It is equipped with both Secondary (SE) and Backscatter (BSE) Electron Detectors and has a fully eucentric 5 axis motorized stage that allows samples up to 25cm in diameter. The Variable Pressure mode allows BSE observation from 6- 270Pa, and the instrument is equipped with a Deben Peltier Coolstage to control moisture loss in low vacuum mode.
More information at http://hitachi-hta.com/products and deben.co.uk