Current Equipment

The laboratory currently has the following electron microscopes:

Zeiss Crossbeam 540 FIB-SEM

Hitachi S-4300 high resolution field emission SEM1 (Acquired through NSF Major Research Instrumentation Program. Award #0421032)

Hitachi H-8100 scanning transmission electron microscope

Hitachi S-3400 

Hitachi S-7650 TEM

 

Analytical Equipment for the microscopes includes:

Hitachi S-4300VP (Provided by NSF-TTU funds)

EDAX X-ray microanalysis system (EDS)/Oxford EDS 

Oxford electron backscatter detector (EBSD)

Gatan cathodoluminescence (CL) spectrophotometer

ETP-USA backscatter detector

Large area mapping of SE/BSE/EDS/EBSD

Scanning Transmissive Electron Microscopy 

Gas Injection System

Ancillary equipment required to produce quality samples for both TEM and SEM: microtomes, ultramicrotomes, sputter coaters, and critical point dryers. In addition to the traditional methods of specimen preparation e.g. glutaraldehyde and osmium tetroxide, this laboratory also uses protocols for physically fixing samples by cryogenic methods.