Patents
Awarded
- H. Sari-Sarraf, E. F. Hequet, C. N. Turner, H. Y. Chan, and A. Zhu, “Fabric Wrinkle Evaluation,” 7,601,978, October 2009.
- S. S. Gleason and H. Sari-Sarraf, “Method for Non-referential Defect Characterization Using Fractal Encoding and Active Contours,” 7,218,772, May 2007.
- H. Sari-Sarraf, E. F. Hequet, and A. Pai, "Method for Identification of Cotton Contaminants with X-ray Microtomographic Image Analysis," 6,870,897, March 2005.
- H. Sari-Sarraf and J. S. Goddard, "4-D Characterization of a Sheet-Forming Web," 6,553,133, April 2003.
- S. S. Gleason, M. A. Hunt, and H. Sari-Sarraf, "Context-Based Automated Defect Classification System Using Multiple Morphological Masks," 6,456,899, September 2002.
- M. J. Paulus, H. Sari-Sarraf, K. W. Tobin, S. S. Gleason, and C. E. Thomas, "Ultra-High Resolution Computed Tomography Imaging," 6,421,409, July 2002.
- M. J. Paulus, H. Sari-Sarraf, M. L. Simpson, and C. L. Britton, Jr., "Simultaneous CT and SPECT Tomography Using CZT Detectors," 6,399,951, June 2002.
- K. W. Tobin, S. S. Gleason, T. P. Karnowski, and H. Sari-Sarraf, "Automated, Defect Spatial Signature Analysis for Semiconductor Manufacturing Process Improvement," 5,982,920, November 1999.
Applied Vision Lab
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Address
Texas Tech University, ECE dept, room 121, 1012 Boston Ave, Lubbock, TX 79409 -
Phone
806.834.6702 -
Email
hamed.sari-sarraf@ttu.edu