Texas Tech University

Patents

Awarded
  1. H. Sari-Sarraf, E. F. Hequet, C. N. Turner, H. Y. Chan, and A. Zhu, “Fabric Wrinkle Evaluation,” 7,601,978, October 2009.
  2. S. S. Gleason and H. Sari-Sarraf, “Method for Non-referential Defect Characterization Using Fractal Encoding and Active Contours,” 7,218,772, May 2007.
  3. H. Sari-Sarraf, E. F. Hequet, and A. Pai, "Method for Identification of Cotton Contaminants with X-ray Microtomographic Image Analysis," 6,870,897, March 2005.
  4. H. Sari-Sarraf and J. S. Goddard, "4-D Characterization of a Sheet-Forming Web," 6,553,133, April 2003.
  5. S. S. Gleason, M. A. Hunt, and H. Sari-Sarraf, "Context-Based Automated Defect Classification System Using Multiple Morphological Masks," 6,456,899, September 2002.
  6. M. J. Paulus, H. Sari-Sarraf, K. W. Tobin, S. S. Gleason, and C. E. Thomas, "Ultra-High Resolution Computed Tomography Imaging," 6,421,409, July 2002.
  7. M. J. Paulus, H. Sari-Sarraf, M. L. Simpson, and C. L. Britton, Jr., "Simultaneous CT and SPECT Tomography Using CZT Detectors," 6,399,951, June 2002.
  8. K. W. Tobin, S. S. Gleason, T. P. Karnowski, and H. Sari-Sarraf, "Automated, Defect Spatial Signature Analysis for Semiconductor Manufacturing Process Improvement," 5,982,920, November 1999.

Applied Vision Lab