The Hitachi H-8100 Scanning/Transmission Electron Microscope (STEM) was donated by Dow Chemical Corporation in 2006. It is a 75kV-200kV STEM that has great versatility for biological imaging, routine high-resolution imaging work as well as variety of analytical applications that can only be performed by TEMs. (see image of 8100)
Biological applications using 75-100 kV include plant and animal cell and tissue ultrastructure, study of proteins, viruses, bacteria, and phages by negative staining, and clinical diagnosis of disease processes in disease tissue.
In its analytical role, the H-8100 has a small probe forming capability that can be used to simultaneously generate electron diffraction patterns, visualize crystalline lattices, and perform elemental spectroscopic analysis using X-ray photons that are produced when high-energy electrons interact with a sample.
The double tilt-axis specimen stage is also computer controlled and operates in linkage with a selected magnification to focus on a target area, thereby stabilizing the high-energy electron beam on a particular area of the sample. A turbo-molecular drag vacuum pump evacuates the specimen chamber to insure the integrity of the vacuum, reduce contamination on the sample (a common problem on high-voltage EMs) as well as to reduce pump-down time for routine specimen exchange and increase filament life.
Because of the inherent stability of the sample stage combined with the clean, hydrocarbon-free vacuum system, the H-8100 transmission electron microscope is guaranteed to produce a point-to-point resolution of 0.21 nm (as compared to 0.15 nm for a new generation field emission TEM, ca $1,200,000). The H-8100 has a unique Hiper side entry goniometer specimen stage that allows increased stability and is highly useful for visualizing 3-dimensional lattices for researchers in the materials sciences, a necessity for imaging the ultra-fine structure of modern laboratory generated nano-scale materials.
This TEM comes equipped with a 1K x 1K digital camera and an EDS system with an optional scanning attachment (STEM) that, when combined, can produce highly detailed structural, qualitative, and quantitative chemical data in a short period of time.