Materials Characterization Center - Facilities
Characterization Techniques
Electron and Other Microscopy
- Scanning Electron Microscopy (SEM)
- Transmission Electron Microscopy (TEM)
- Focused Ion & Electron Beam (FIB-SEM) System
- Sputter & Carbon Coater
- Atomic Force Microscopy (MFP-3D-SA AFM)
- Atomic Force Microscopy (Dimension Icon)
- Spinning Disk Confocal System
- Optical (Visible-Light) Microscopy
Spectroscopy
- Fourier Transform Infrared (FTIR) Spectroscopy/Infrared (IR) Microscopy
- Fourier Transform Raman (FT-Raman) Spectroscopy/Fourier Transform Raman (FT-Raman)
Microscopy/Dispersive Raman Microscopy/Spectroscopy
- UV-Vis-NIR Spectroscopy
- Gas Chromatograph-Mass Spectroscopy (GC-MS)
- X-ray Photoelectron Spectroscopy (XPS)
- Scanning Electron Microscopy with Energy Dispersive X-Ray Spectroscopy (SEM-EDS)
- Transmission Electron Microscopy with Energy Dispersive X-Ray Spectroscopy (TEM-EDS)
- Focused Ion & Electron Beam System with Energy Dispersive X-Ray Spectroscopy (FIB-SEM-EDS)
Particle Size, Pore and Surface Analysis
- Particle Size Analysis (Zetatrac)
- Particle Size Analysis (API Aerosizer)
- Micropore/Mesopore Analysis
- Zeta Potential Analysis
Thermal Analysis
- Differential Scanning Calorimetry (DSC)
X-Ray Diffraction Analysis
- X-ray Diffractometry (MiniFlex 6G)
- X-ray Diffractometry (SmartLab 3kW XE)
Other Equipment
- Vacuum Oven
- Ovens
- Furnaces
- Centrifuge
- HF-Resistant Hood
- Biosafety BSL2 Hood
