Materials Characterization Center
Overview
The Texas Tech University Materials Characterization Center is designed to support a complete range of materials studies, including synthesis, analytical characterization, and applications testing.
Contact
To schedule times or for questions on the equipment, contact Dr. Juliusz Warzywoda at 806.834.2560 or juliusz.warzywoda@ttu.edu.
Requirements
Permission to use the laboratory is contingent upon completion of Texas Tech University approved safety training programs, laboratory and technique/equipment specific training, and acknowledgement that you have read and understood both the general lab safety rules governing responsible laboratory use and all safety and training protocols and documentation specific to this laboratory.
Hardcopies of valid (no older than 2 years) Lab Safety and Safety Awareness certificates need to be provided prior to using any equipment in the Center. Please see the following link for more information https://www.depts.ttu.edu/ehs/Training/.
Rates
Equipment | Specifications | Internal Student Chargea | Internal Technical Chargeb | External Chargec |
---|---|---|---|---|
X-ray Diffractometer (MiniFlex 6G) Rigaku MiniFlex 6G X-ray diffractometer |
MiniFlex 6G | $20/h | $65/hr | $115/h |
X-ray Diffractometer (SmartLab 3kW XE) Rigaku SmartLab 3kW XE X-ray diffractometer | SmartLab 3kW XE | $35/hr | $75/hr | $125/hr |
Field Emission Scanning Electron Microscope (FE-SEM) Hitachi S-4700 field emission scanning electron microscope (FE-SEM) equipped with EDAX energy dispersive X-ray (EDX) spectrometer |
S-4700 FE-SEM | $40/hr | $75/hr | $155/hr |
Transmission Electron Microscope (TEM) Hitachi H-9500 transmission electron microscope (TEM) equipped with EDAX energy dispersive X-ray (EDX) spectrometer |
H-9500 TEM | $55/hr | $85/hr | $200/hr |
Focused Ion & Electron Beam (FIB-SEM) System Hitachi NB5000 focused ion & electron beam (FIB-SEM) system equipped with EDAX energy dispersive X-ray (EDX) spectrometer |
NB5000 FIB-SEM | $60/hr | $95/hr | $200/hr |
X-ray Photoelectron Spectrometer (XPS) Physical Electronics PHI 5000 VersaProbe II Hybrid X-ray photoelectron spectrometer (XPS) |
PHI 5000 VersaProbe II XPS | $50/hr | $80/hr | $200/hr |
Atomic Force Microscope (MFP-3D-SA AFM) Asylum Research MFP-3D-SA atomic force microscope (AFM) |
MFP-3D-SA AFM | $25/hr | $60/hr | $115/hr |
Atomic Force Microscope (Dimension Icon) Bruker Dimension Icon with ScanAsyst atomic force microscope (AFM) |
Dimension Icon | $25/hr | $60/hr | $115/hr |
Fourier Transform Infrared (FTIR) Spectrometer/Infrared (IR) Microscope Bruker Optics VERTEX 70 Fourier transform infrared (FTIR) spectrometer/HYPERION 2000 infrared (IR) microscope |
VERTEX 70-HYPERION 2000 | $30/hr | $65/hr | $125/hr |
Fourier Transform Raman (FT-Raman) Spectrometer/Fourier Transform Raman (FT-Raman)
Microscope/Dispersive Raman Microscope Spectrometer Bruker Optics RAM II FT-Raman spectrometer module/RamanScope III FT-Raman microscope module/SENTERRA dispersive Raman microscope spectrometer |
RAM II-RamanScope III-SENTERRA | $30/hr | $65/hr | $125/hr |
Spinning Disk Confocal System 3i Marianas spinning disk confocal system |
3i Marianas Spinning Disk Confocal | $45/hr | $75/hr | $155/hr |
UV-Vis-NIR Spectrophotometer Agilent/Varian Cary 5000 UV-Vis-NIR spectrophotometer |
Cary 5000 UV-Vis-NIR | $30/hr | $65/hr | $125/hr |
Thermogravimetric Analyzer (TGA) Mettler Toledo TGA/SDTA851e module thermogravimetric analyzer |
TGA-SDTA851e | $12.50/hr | $45/hr | $110/hr |
Differential Scanning Calorimeter (DSC) Mettler Toledo DSC822e module differential scanning calorimeter |
DSC822e | $12.50/hr | $45/hr | $110/hr |
Particle Size Analyzer (Zetatrac) Microtrac Zetatrac Ultra particle size & zeta potential analyzer, particle size measuring range 0.8 nm-6.5 μm |
Zetatrac | $18/hr | $45/hr | $110/hr |
Particle Size Analyzer (API Aerosizer) TSI API Aerosizer particle size analyzer, particle size measuring range 0.2-700 μm |
API Aerosizer | $18/hr | $45/hr | $110/hr |
Micropore Analyzer Quantachrome Autosorb iQ-MP micropore analyzer |
Autosorb iQ-MP | $15/sample | $45/sample | $110/sample |
Zeta Potential Analyzer Particle Metrix Stabino particle charge mapping system |
Stabino | $18/hr | $45/hr | $110/hr |
Gas Chromatograph-Mass Spectrometer (GC-MS) Agilent 7820A gas chromatograph (GC)-5977B mass selective detector (MSD) system |
7820A GC-5977B MS | $40/sample | $75/sample | $110/sample |
Sputter & Carbon Coater EMS Q150V ES Plus Sputter & Carbon Coater |
Q150V ES Plus | $20/run | $40/run | $90/run |
Sample Preparation | $25/hr | $25/hr | $25/hr | |
Instrument Training | $30/hr |
a Internal Student users are Texas Tech University students and other Texas Tech University employees who have been trained in the equipment use by the Center staff.
b Internal Technical users are Texas Tech University students and other Texas Tech University employees who have elected to have analysis performed by the Center staff.
c External users are the individuals/institutions external to Texas Tech University.
Edward E. Whitacre Jr. College of Engineering
-
Address
100 Engineering Center Box 43103 Lubbock, Texas 79409-3103 -
Phone
806.742.3451 -
Email
webmaster.coe@ttu.edu