Texas Tech University

Materials Characterization Center


The Texas Tech University Materials Characterization Center is designed to support a complete range of materials studies, including synthesis, analytical characterization, and applications testing.


To schedule times or for questions on the equipment, contact Dr. Juliusz Warzywoda at 806.834.2560 or juliusz.warzywoda@ttu.edu.


Permission to use the laboratory is contingent upon completion of Texas Tech University approved safety training programs, laboratory and technique/equipment specific training, and acknowledgement that you have read and understood both the general lab safety rules governing responsible laboratory use and all safety and training protocols and documentation specific to this laboratory.

Hardcopies of valid (no older than 2 years) Lab Safety and Safety Awareness certificates need to be provided prior to using any equipment in the Center. Please see the following link for more information https://www.depts.ttu.edu/ehs/Training/.


Equipment Specifications Internal Student Chargea Internal Technical Chargeb External Chargec
X-ray Diffractometer (MiniFlex 6G)
Rigaku MiniFlex 6G X-ray diffractometer
MiniFlex 6G $20/h $65/hr $115/h
X-ray Diffractometer (SmartLab 3kW XE) Rigaku SmartLab 3kW XE X-ray diffractometer SmartLab 3kW XE $35/hr $75/hr $125/hr
Field Emission Scanning Electron Microscope (FE-SEM)
Hitachi S-4700 field emission scanning electron microscope (FE-SEM) equipped with EDAX energy dispersive X-ray (EDX) spectrometer
S-4700 FE-SEM $40/hr $75/hr $155/hr
Transmission Electron Microscope (TEM)
Hitachi H-9500 transmission electron microscope (TEM) equipped with EDAX energy dispersive X-ray (EDX) spectrometer
 H-9500 TEM $55/hr $85/hr $200/hr
Focused Ion & Electron Beam (FIB-SEM) System
Hitachi NB5000 focused ion & electron beam (FIB-SEM) system equipped with EDAX energy dispersive X-ray (EDX) spectrometer
NB5000 FIB-SEM $60/hr $95/hr $200/hr
X-ray Photoelectron Spectrometer (XPS)
Physical Electronics PHI 5000 VersaProbe II Hybrid X-ray photoelectron spectrometer (XPS)
PHI 5000 VersaProbe II XPS $50/hr $80/hr $200/hr
Atomic Force Microscope (MFP-3D-SA AFM)
Asylum Research MFP-3D-SA atomic force microscope (AFM)
MFP-3D-SA AFM $25/hr $60/hr $115/hr
Atomic Force Microscope (Dimension Icon)
Bruker Dimension Icon with ScanAsyst atomic force microscope (AFM)
Dimension Icon $25/hr $60/hr $115/hr
Fourier Transform Infrared (FTIR) Spectrometer/Infrared (IR) Microscope
Bruker Optics VERTEX 70 Fourier transform infrared (FTIR) spectrometer/HYPERION 2000 infrared (IR) microscope
VERTEX 70-HYPERION 2000 $30/hr $65/hr $125/hr
Fourier Transform Raman (FT-Raman) Spectrometer/Fourier Transform Raman (FT-Raman) Microscope/Dispersive Raman Microscope Spectrometer
Bruker Optics RAM II FT-Raman spectrometer module/RamanScope III FT-Raman microscope module/SENTERRA dispersive Raman microscope spectrometer
RAM II-RamanScope III-SENTERRA $30/hr $65/hr $125/hr
Spinning Disk Confocal System
3i Marianas spinning disk confocal system
3i Marianas Spinning Disk Confocal $45/hr $75/hr $155/hr
UV-Vis-NIR Spectrophotometer
Agilent/Varian Cary 5000 UV-Vis-NIR spectrophotometer
Cary 5000 UV-Vis-NIR $30/hr $65/hr $125/hr
Thermogravimetric Analyzer (TGA)
Mettler Toledo TGA/SDTA851e module thermogravimetric analyzer
TGA-SDTA851e $12.50/hr $45/hr $110/hr
Differential Scanning Calorimeter (DSC)
Mettler Toledo DSC822e module differential scanning calorimeter
DSC822e $12.50/hr $45/hr $110/hr
Particle Size Analyzer (Zetatrac)
Microtrac Zetatrac Ultra particle size & zeta potential analyzer, particle size measuring range 0.8 nm-6.5 μm
Zetatrac $18/hr $45/hr $110/hr
Particle Size Analyzer (API Aerosizer)
TSI API Aerosizer particle size analyzer, particle size measuring range 0.2-700 μm
 API Aerosizer $18/hr $45/hr $110/hr
Micropore Analyzer
Quantachrome Autosorb iQ-MP micropore analyzer
Autosorb iQ-MP $15/sample $45/sample $110/sample
Zeta Potential Analyzer
Particle Metrix Stabino particle charge mapping system
Stabino $18/hr $45/hr $110/hr
Gas Chromatograph-Mass Spectrometer (GC-MS)
Agilent 7820A gas chromatograph (GC)-5977B mass selective detector (MSD) system
7820A GC-5977B MS $40/sample $75/sample $110/sample
Sputter & Carbon Coater
EMS Q150V ES Plus Sputter & Carbon Coater
Q150V ES Plus $20/run $40/run $90/run
Sample Preparation   $25/hr $25/hr $25/hr
Instrument Training   $30/hr    

a Internal Student users are Texas Tech University students and other Texas Tech University employees who have been trained in the equipment use by the Center staff.

b Internal Technical users are Texas Tech University students and other Texas Tech University employees who have elected to have analysis performed by the Center staff.

c External users are the individuals/institutions external to Texas Tech University.